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 Patents Issused in 2002

The following is a list of the patents awarded to SEH during 2002. Each US patent's title will link to a full text of that patent on the United States Patent and Trademark Office web site.

Patent No. Title Issued Inventor(s)
US
 6,338,756
IN-SITU EPITAXIAL TREATMENT PROCESS 01/15/02 Dietze
US
 6,339,011
Method Of Forming Semiconductive Active Area Having A Proximity Gettering Region Therein And Method Of Processing A Monocrystalline Silicon Substrate To Have A Proximity Gettering Region 01/15/02 Koveshnikov
US 
6,346,460
Low Cost Silicon Substrate With Impurity Gettering and Latch Up Protection and Method of Manufacture 02/12/2002 Kononchuk,
Koveshnikov
US
6,348,870
Melt Spill Indicator Device 02/19/2002 Anderson
Aydelott
US
6,350,315
Methods of Producing Doped Semiconductors 02/26/2002 Anderson
US
6,352,071
Apparatus and Method for Reducing Bow and Warp in Silicon Wafers Sliced by a Wire Saw 03/05/2002 Kononchuk
Preece
US
6,354,794
Method For Automatically Transferring Wafers Between Wafer Holders in a Liquid Environment 03/12/2002 Sato
Fukabori
Mulkaino 
US
6,370,972
Chemical Sampling Sink 4/16/2002 Bomber
Hamilton
US
6,375,749
Susceptorless Semiconductor  Wafer Support and Reactor System For Epitaxial Layer Growth 4/23/2002 Boydston
Dietze
Hartmann
JP
3294856
Heat Shield Assembly and Method for Improving Mechanical Strength of the Neck section of CZ Silicon Crystal  4/5/2002 Tamura
Wijaranakula
US
6,395,085
Purity Silicon Wafer for Use in Advanced Semiconductor Devices 5/28/2002 Dietze
Hanna (Sean)
Radzimski
US 6,398,382 Apparatus and Method for Indicating Liquid Level in a Chemical Tank 6/4/2002 Boyce          Brinkman
US 6,402,957 Bromine Biocide Removal 6/11/2002 Boyce
US 6,409,463 Apparatuses and Methods for Adjusting a Substrate Centering System 6/25/2002 Croft (Brett) Huston (Michael
US 6,416,391 Method of Dismounting Wafers after Polishing 7/9/2002 Kononchuk Radzimski
US 6,416,392 Sound Enhanced Lapping Process 7/9/2002 Fitzgerald, Swanson, Zinser
US 6,416,669 Resin Trap Device for Use in Ultrapure Water Systems and method 7/9/2002 Boyce, Marchando, Webster
US 6,423,556 Method for Evaluating Impurity Concentrations in Heat Treatment Furnaces 7/23/2002 Koveshnikov, Anderson
US 6,426,133 Graphite Material Coated with Silicon Carbide 7/30/2002 Salstrom
US 6,439,856 Inline Stroke Counter for Air Pumps 8/27/2002 Ivey
US 6,453,742 System and Method for Calibrating Semiconductor Processing Equipment 9/24/2002 White, Kraxberger
US 6,454,852 High Efficiency Silicon Wafer Optimized for Advanced Semiconductor Devices 9/24/2002 Dietze, Hanna (Sean), Radzimski
US 6,457,929 Apparatus and Method for Automatically Transferring Wafers between Wafer Holders in a Liquid Environment 10/1/2002 Sato, Fukabori, Mukaino
US 6,471,771 In-Situ Post Epitaxial Treatment Process 10/29/2002 Dietze
US 6,475,385 Resin Trap Device for Use in Ultrapure Water Systems & Method of Purifying Water Using Same 11/5/2002 Boyce, Marchando, Webster
US 6,482,749 Method for Etching a Wafer Edge Using Potassium-Based Chemical Oxidizer in the Presence of Hydrofluoric Acid 11/19/2002 Harrison, Huang, Billington
US 6,488,768 Method and Apparatus for Treating Discharge Gas from a CZ Crystal Growing Chamber Utilizing Water Spray 12/3/2002 Nettleton
US 6,497,765 Multi Piece Swivel Chuck for Holding Conical Shaped Work 12/24/2002 Nice